For years the industry has been focused on the use of Adaptive Test techniques to streamline and focus our test efforts for maximum value (and minimum test times). With the advent of Neural Network techniques (i.e. AI) new possibilities are coming to light for focusing our vision on areas where improvements can provide value. This presentation provides an overview of Adaptive Test and Neural Network techniques and then shares a vision for merging the two techniques together in order to improve our device quality, reduce our cost of test, and automate the control of functions best left to the computers supporting us.